| dc.contributor.author | Andabwa, T. A. | |
| dc.contributor.author | Muiru, A. | |
| dc.contributor.author | Macharia, S. | |
| dc.date.accessioned | 2025-07-14T09:32:01Z | |
| dc.date.available | 2025-07-14T09:32:01Z | |
| dc.date.issued | 2025 | |
| dc.identifier.uri | http://repository.kyu.ac.ke/123456789/1171 | |
| dc.description.abstract | Examination of the relationship between personality types (five-factor model and its relationship) and career paths of TVET trainees in Kenya is critical. A correlational approach and regression analysis identified the association and regression line connecting independent and dependent variables. The targeted respondents were 1,007 individuals in seven purposely selected TVET institutions. A multi-stage random sampling method was used to select 321 respondents from this population. Data collection tools were questionnaires for TVET trainees and interview schedules for career masters/deans of students. The validity of the research tools was evaluated, and reliability was tested using Cronbach's Alpha, resulting in scores of 0.754 for the personality types Scale and 0.775 for the career paths Scale. Regression analysis indicated that the five personality Types explained 19.1 % of the variance in career path choices. The study resulted in positive correlation coefficient between the five major personality factors and career paths. The results showed statistically significant differences in the levels of the five major personality factors and career paths. The findings are expected to make available information on psychological characteristics underlying career paths for theory and practice since the promotion of appropriate personality is necessary for all students of all educational levels. | en_US |
| dc.publisher | Journal of Humanities and Social Science | en_US |
| dc.subject | five-factor model of personality, career paths, TVET trainees | en_US |
| dc.title | Influence of the big five on career paths among Trainees in TVET Institutions. | en_US |
| dc.type | Article | en_US |